1. Preparation and Study of Bismuth Rare-Earth Tungstate Composite Screen-Printed Thick Films.
- Author
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Rocha, G.N., Melo, L.F.L., Dantas, S.M., Ayala, A.P., Sombra, A.S.B., Almeida, A.F.L., Menezes, A.S., and Fechine, P.B.A.
- Subjects
BISMUTH ,RARE earth metals ,TUNGSTATES ,DIELECTRIC measurements ,THICK films - Abstract
In this paper, we report the microstructural and dielectric properties of bismuth rare-earth tungstate composite screen-printed thick films (BiGd NdWO, BiGdYWO, and BiYNdWO). The crystal structure of BiREWO (RE = Gd, Nd, and Y) can be associated with the BiWO perovskite structure. It was observed that the crystalline structure was attributed to a monoclinic phase with space group A12/m1. BiYWO and BiYGdWO films showed characteristics of the dielectric relaxation phenomenon. The thick films exhibited moderate dielectric permittivity ( ε′) values from 10 to 42. The results showed that the obtained ε′ values for films can be useful for capacitor applications and certainly for microelectronics and microwave devices (mobile phones, for example), where miniaturization of devices is crucial. [ABSTRACT FROM AUTHOR]
- Published
- 2013
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