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A two-step measurement procedure has been proposed for measurement of complex permittivity of dielectric materials using one-port reflection measurements. In the procedure, as a first step, a graphical method is applied to analyze on the complex reflection-coefficient plane the general pattern of dielectric behavior of the sample. Then, as a second step, optimization algorithms are utilized for retrieving electrical properties of samples. The procedure requires measurement of complex reflection scattering parameters of at least two samples with different lengths. It has been validated by X-band measurements of three polyvinyl chloride samples with lengths 5, 10, and 20 mm. [ABSTRACT FROM AUTHOR]