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2. High-resolution non-destructive three-dimensional imaging of integrated circuits.

3. Nanostructure surveys of macroscopic specimens by small-angle scattering tensor tomography.

4. Ptychographic X-ray computed tomography at the nanoscale.

5. Comparison of quasistatic to impact mechanical properties of multiwall carbon nanotube/polycarbonate composites.

6. Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources.

7. Comparison of quasistatic to impact mechanical properties of multiwall carbon nanotube/polycarbonate composites.

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