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In the present paper, we analyze the role of in situ grown BaZrO (BZO) inclusions in YBaCuO (YBCO) thin films prepared by chemical solution deposition using a low fluorine coating solution, on the field angle dependence of the critical current density, J( 휃), data using the vortex path model. In order to form a coherent picture on the BZO doping influence on the pinning properties of the YBCO matrix, detailed structural analyses performed by X-ray diffraction techniques and microstructural evaluation by transmission electron microscopy are also presented. The evaluation of different contributions to the overall, J, permitted us to prove the effectiveness of the BZO inclusions acting as isotropic pinning centers, reflected in a uniform component of high relative value with respect to other components. For the studied 10 mol % BZO doping concentration, a threefold increase in the critical current density, J, of the YBCO host is measured, in self-field at 77 K, corresponding to a value of J=2.9MA/cm, whereas a factor 10 is measured at 1 T ( J=0.35 MA/cm). [ABSTRACT FROM AUTHOR]

In this article authors present similarities between an article by J.G. Zhu and colleagues regarding measurement of the residual stress in thermal barrier coatings (TBCs) using a self developed deformation sensor and the article regarding the same by M. Sebastiani and colleagues published in the previous issue. Topics discussed include similarity in experimental implementation, use of scanning electron microscope images, and use of micro-ring core method for thermal spray coatings.