18 results on '"Simon, Klaus"'
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2. DIN 6164 for Gamut Mapping?
3. Aspects of computational geometry in gamut mapping implementations
4. Filter methods to preserve local contrast and to avoid artifacts in gamut mapping
5. An RGB color management concept based on an improved gamut mapping algorithm
6. Imaging performance optimization for hyper-NA scanner systems in high volume production
7. A framework for image-dependent gamut mapping
8. Toward image-dependent gamut mapping: fast and accurate gamut boundary determination
9. Continuity of gamut mapping algorithms
10. Collinearity and stitching performance on an ASML stepper
11. Sub-100-nm imaging in x-ray lithography
12. X-ray mask fabrication at CXrL
13. X-ray lithography: a system integration effort
14. Analysis and identification of factors contributing to the overlay budget
15. Resolution and components of critical dimension variation in x-ray lithography
16. Alignment accuracy improvement by consideration of wafer processing impacts
17. Impact of chuck flatness on wafer distortion and stepper overlay
18. Alignment and overlay accuracy of an advanced x-ray stepper using an improved alignment system (Poster Paper)
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