1. Time dependence of organic polymer thin film transistor current
- Author
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Michael C. Hamilton, Sandrine Martin, Jerzy Kanicki, and Laurence Dassas
- Subjects
Materials science ,business.industry ,Transistor ,Electrical engineering ,law.invention ,Threshold voltage ,Organic semiconductor ,Semiconductor ,Thin-film transistor ,law ,Optoelectronics ,Thin film ,Current (fluid) ,business ,Polarization (electrochemistry) - Abstract
We present results on the electrical characterization of gate-planarized organic polymer thin-film transistors (OP-TFTs). We investigated the time dependence of the OP-TFT current. Over a relatively short time range (several 100ms), we observed a decrease of the OP-TFT current corresponding to the establishment of the steady-state regime, and is slower when the transistor is in the weak accumulation regime or in the OFF-state. We believe that this is associated with carrier thermalization in the organic semiconductor. Over longer time scales, the decrease of the OP-TFT current is due to device aging and can be associated with a threshold voltage shift, up to 20V after an electrical stress at V GS =-30V for 30min at room temperature. This shift is fully reversible once the gate polarization is removed and might be associated with charge trapping in the semiconductor.
- Published
- 2003
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