52 results on '"Kim, Seung-Woo"'
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2. Frequency comb-to-comb synchronization between a 1.3-km free-space link via an optical frequency transfer
3. Absolute distance measurement system for precise 3D positioning
4. Multiple absolute distances-based 3D coordinate measurement system for mobile machines
5. Direct comb multi-heterodyne interference spectroscopy
6. Stabilization of two frequency combs with a small relativefceojitter using diode laser injection locking
7. Generation of multiple optical frequencies referenced to a frequency comb for precision free-space frequency transfer
8. EUV generation by plasmonic field enhancement using nanostructures
9. Recent advances in absolute distance measurements using femtosecond light pulses
10. Absolute distance measurement using frequency-comb-referenced four-wavelength interferometry
11. Precision 3D surface measurement of step-structures using mode-locked femtosecond pulses
12. Nanoplasmonic generation of ultrashort EUV pulses
13. High precision surface-profile metrology by scanning the repetition rate of femtosecond pulses
14. Plasmonic field enhancement for generating ultrashort extreme-ultraviolet light pulses
15. High harmonic generation by guided surface plasmon polaritons
16. High harmonics generation by plasmonic field enhancement
17. Design of nanostructures for high harmonic generation by localized surface plasmon resonance
18. Continuous scanning phase measurement for high immunity to vibration
19. Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures
20. Surface metrology of silicon wafers using a femtosecond pulse laser
21. Simultaneous measurements of thin-film thickness and refractive index by dispersive white-light interferometry
22. Grating projection Moire interferometry for high-speed 3D inspection of mesoscale objects
23. Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays
24. AFM-based nanofabrication with femtosecond pulse laser radiation
25. Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser
26. Dispersive interferometry using femtosecond pulse laser for measuring refractive index and physical thickness of test samples
27. Absolute distance measurement using femtosecond laser
28. Point-diffraction fiber interferometer for vibration desensitization
29. Dispersive white-light interferometry for thin-film thickness profile measurement
30. Nonparaxial Fresnel diffraction from oblique end facets of optical fibers
31. Low-coherence interferometry for 3D measurements of microelectronics packaging and integration
32. Two-point diffraction interferometer for absolute distance measurement
33. Point-diffraction interferometer for 3D profile measurement of rough surfaces
34. Error propagation in calibration of e-beam lithography stages
35. Oblique point-diffraction source for interferometer design
36. Phase-shifting diffraction grating interferometer for testing concave mirrors
37. Fiber optic diffraction interferometer for testing spherical mirrors
38. Compensation for phase change on reflection in white-light scanning interferometry
39. Super-heterodyning phase measurement for heterodyne interferometry
40. Multipoint diffraction interferometry for 3D profilometry
41. Phase-shifting projection moire for out-of-plane displacement measurement
42. Automatic inspection of geometric accuracy of optical fiber ferrules by machine vision
43. Compensation of phase change upon reflection in white light interferometry
44. Scanning projection grating moire topography
45. White-light scanning interferometry for thickness measurement of thin film layers
46. Rapid defect inspection of display devices with optical spatial filtering
47. White light phase-shifting interferometry with self-compensation of PZT scanning errors
48. Two-frequency phase-shifting projection moire topography
49. Statistical analysis on the measuring resolution of edge position by digital imaging
50. Three-dimensional profile measurement of fine objects by phase-shifting shadow moire interferometry
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