1. An accurate measurement of the dipole orientation in various organic semiconductor films using photoluminescence exciton decay analysis
- Author
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Ramchandra Pode, Gyeong Woo Kim, Ik Jang Ko, Hyuna Lee, Jang Hyuk Kwon, Raju Lampande, and Jin Hwan Park
- Subjects
Photoluminescence ,Materials science ,Exciton ,Doping ,General Physics and Astronomy ,02 engineering and technology ,010402 general chemistry ,021001 nanoscience & nanotechnology ,01 natural sciences ,Molecular physics ,Fluorescence ,0104 chemical sciences ,Organic semiconductor ,Condensed Matter::Materials Science ,Dipole ,Physical and Theoretical Chemistry ,0210 nano-technology ,Phosphorescence ,Anisotropy - Abstract
In this study, we report an accurate and more reliable approach to estimate the dipole orientation of emitters especially phosphorescence, fluorescence and even thermally activated delayed fluorescence. The dipole orientation measurements are performed by examining the variation of the photoluminescence (PL) exciton decay rate from time-resolved PL and optical analysis. Our anisotropic dipole orientation results are consistent with those of previous reports. The studied measurement approach is very reliable and accurate to estimate the dipole orientation of any organic semiconductor materials regardless of whether they are doped or neat films.
- Published
- 2019
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