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An efficient method for calculating scattering patterns of large finite arrays illuminated by an obliquely incident plane wave is presented in this paper. Based on the element-varying active element factor (AEF) technique, this method takes the element mutual coupling and edge effects into account, and it results in accurate solutions. From the periodicity and distribution properties of induced currents, various elements are combined according to a certain rule. The determination of element combination is related to the plane wave incident angle. Thus, the scattering pattern of a large finite array can be calculated with superposition of combined-elements in a relatively small array. Numerical examples of onedimensional (1-D) and two-dimensional (2-D) arrays verify the accuracy and efficiency of the proposed method. [ABSTRACT FROM AUTHOR]

In this paper, an efficient approach for calculating the far field pattern of one-dimensional (l-D) and two-dimensional (2-D) finite patch arrays is proposed. Based on the active element factor (AEF) defined specifically for scattering problems, this proposed method takes into account the effects of mutual couplings and array edges. From the induced current distribution on an array with odd or even elements, the array is divided into different parts and neglects the weak mutual coupling affected by far elements for each part. Thus, the element-varying AEF method changes a large array problem into a superposition of various simplified subarray problems. Three examples verify the accuracy and efficiency of the proposed method. Furthermore, the results show that the proposed method with the element-varying AEF technique has the ability to solve the scattering problems of rather large arrays whereas other methods become incapable due to computer hardware limitations. [ABSTRACT FROM AUTHOR]