1. A grain boundary phase transition in Si-Au
- Author
-
Ma, Shuailei, Asl, Kaveh Meshinchi, Tansarawiput, Chookiat, Cantwell, Patrick R., Qi, Minghao, Harmer, Martin P., and Luo, Jian
- Subjects
Condensed Matter::Soft Condensed Matter ,Grain boundary ,Phase transition ,Complexion ,Interfaces ,Aberration-corrected STEM ,NICKEL-DOPED TUNGSTEN ,INTERGRANULAR FILMS ,AMORPHOUS FILMS ,BI2O3-DOPED ZNO ,SURFICIAL FILMS ,INTERFACES ,SURFACES ,COMPLEXION ,ALUMINA ,OXIDE ,Nanoscience and Nanotechnology - Abstract
A grain boundary transition from a bilayer to an intrinsic (nominally clean) boundary is observed in Si-Au. An atomically abrupt transition between the two complexions (grain boundary stabilized phases) implies the occurrence of a first-order interfacial phase transition associated with a discontinuity in the interfacial excess. This observation supports a grain-boundary complexion theory with broad applications. This transition is atypical in that the monolayer complexion is absent. A model is proposed to explain the bilayer stabilization and the origin of this complexion transition. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. more...
- Published
- 2012