14 results on '"Pekin, Thomas C."'
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2. Comparison of Compression Methods for Ptychographic Reconstructions through Decomposition of the Diffraction Patterns in Orthonormal Bases.
3. Fast Grain Mapping with Sub-Nanometer Resolution Using 4D-STEM with Grain Classification by Principal Component Analysis and Non-Negative Matrix Factorization.
4. py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis.
5. Approaches Taken to Streamline and Consolidate Large Dataset Processing Techniques, with a Focus on Ptychography.
6. High Resolution Three-Dimensional Reconstructions in Electron Microscopy Through Multifocus Ptychography.
7. ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction.
8. Experimental and Simulation Methods in Scanning Electron Nanobeam Diffraction.
9. Deformation localization in metallic glasses studied by in situ TEM deformation.
10. In situ Nanobeam Electron Diffraction of Bulk Metallic Glasses.
11. Deformation localization in metallic glasses studied by in situ TEM deformation.
12. Experimental and Simulation Methods in Scanning Electron Nanobeam Diffraction.
13. In situ Nanobeam Electron Diffraction of Bulk Metallic Glasses.
14. In situ Strain Mapping of Planar Slip in 304 Stainless Steel.
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