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High-contrast angular intensity fringes are generated by reflecting laser light from an uncoated spiral phase plate (SPP) device for the first time, to the best of our knowledge. As the laser frequency going into the device is tuned, the fringes rotate. Measured transverse fringe patterns match their theoretical predicted values. They have unity contrast, and their measured intensity varies with laser frequency in a fashion similar to a Fabry-Perot etalon. This effect can be used to enable new miniature devices for angle metrology, imaging, and microscopy.

Several recently developed particle-tracking and imaging methods have achieved three-dimensional sensitivity through the introduction of angled micromirrors into the observation volume of an optical microscope. We model the imaging response of such devices and show how the direct and reflected images of a fluorescent particle are affected. In particle-tracking applications, asymmetric image degradation manifests itself as systematic tracking errors. Based on our results, we identify strategies for reducing systematic errors to the 10nm level in practical applications.

We introduce a fast and robust technique for single-particle tracking with nanometer accuracy. We extract the center-of-mass of the image of a single particle with a simple, iterative algorithm that efficiently suppresses background-induced bias in a simplistic centroid estimator. Unlike many commonly used algorithms, our position estimator requires no prior information about the shape or size of the tracked particle image and uses only simple arithmetic operations, making it appropriate for future hardware implementation and real-time feedback applications. We demonstrate it both numerically and experimentally, using an inexpensive CCD camera to localize 190 nm fluorescent microspheres to better than 5 nm.