1. Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy.
- Author
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Zheng Z, Own CS, Wanner AA, Koene RA, Hammerschmith EW, Silversmith WM, Kemnitz N, Lu R, Tank DW, and Seung HS
- Abstract
Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a threefold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of four beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in five weeks., (© 2024. The Author(s).)
- Published
- 2024
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