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Despite considerable research efforts, the influence of contact line tension during wetting at the nanoscale and its experimental determination remain challenging tasks. So far, molecular dynamics simulations and atomic force microscope measurements have contributed to the understanding of these phenomena. However, a direct measurement of the size dependence of the contact angle and the magnitude of the apparent line tension has not been realized so far. Here, we show that the contact angle is indeed dependent on the drop size for small drop diameters and determine the magnitude of the apparent line tension via liquid-metal based measurements of advancing and receding contact angle inside a scanning electron microscope. For this purpose, a robotic setup inside an electron microscope chamber and oxide-free Galinstan droplets-produced via an electromigration-based and focused ion beam irradiation-assisted process-are employed. Using the first-order correction of Young's equation, we find an apparent line tension value of 4.02 × 10 -7 J/m for Galinstan© on stainless steel.

The focused ion beam (FIB) has proven to be an extremely powerful tool for the nanometer-scale machining and patterning of nanostructures. In this work, we experimentally study the behavior of AISI 420 martensitic stainless steel when bombarded by Ga + ions in a FIB system. The results show the formation of nanometer sized spiky structures. Utilizing the nanospiking effect, we fabricated a single-tip needle with a measured 15.15 nanometer curvature radius and a microneedle with a nanometer sized spiky surface. The nanospikes can be made straight or angled, depending on the incident angle between the sample and the beam. We also show that the nanospiking effect is present in ferritic AISI 430 stainless steel. The weak occurrence of the nanospiking effect in between nano-rough regions (nano-cliffs) was also witnessed for austenitic AISI 316 and martensitic AISI 431 stainless steel samples.