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The meniscus-confined electrodeposition (MCED) technique offers advantages such as low cost and wide applicability, making it a promising method in the field of micro/nanofabrication. However, unstable meniscal morphology and poor deposition quality during planar deposition in MCED necessitate the development of improved methods. Therefore, a planar adaptive micro-tuning deposition method (PAMTDM), which utilizes the positioning technology of scanning electrochemical cell microscopy (SECCM) and employs a singular value decomposition (SVD) planar fitting method to determine the flatness of the deposition plane, is proposed. An adaptive micro-tuning motion mode was proposed by analyzing the variation patterns of the meniscus. Moreover, a combination of multi-physics finite element simulations and orthogonal experimental methods was introduced to determine the optimal motion parameters. The experimental results demonstrate that the PAMTDM effectively addresses the issues encountered during planar growth. Compared to the point-by-point deposition method, the PAMTDM achieves a threefold increase in deposition speed for continuous deposition of 105-μm-long line segments in two-dimensional planes, with a deposition current error of less than 0.2 nA. In conclusion, the proposed method provides significant insights into the broad future applications of MCED. [ABSTRACT FROM AUTHOR]

To avoid depth-of-field mismatches caused by the changes in pipe structure and image overexposures caused by highly reflective surfaces while radial imaging irregular pipes, this paper proposes a novel all-in-focus, adaptable, and low scene-coupling method that suppresses overexposures in support of fault detection. Firstly, the pipeline's radial depth distribution data are obtained by sensors, and an optimal all-in-focus imaging scheme is established by combining camera parameters. Secondly, using digital imaging technology, the high reflection effect produced by disparate light sources is comprehensively evaluated for overexposure suppression. Thirdly, a device is designed for imaging non-Lambertian free-form surface scenes under low illumination, providing the sequence images needed for the next step. Lastly, specific digital fusions are made to the sequential images to obtain an all-in-focus final image without overexposure. An image-quality analysis method is then used to measure the efficacy of the system in obtaining the characteristic information of the inner surfaces of an irregular pipe. Results of the experiment show that the method and device used are able to distinguish small 0.5 mm wide lines ranging from 40–878 mm depth and are capable of providing efficient image support for defect inspection of irregular pipes and free-form surfaces amongst other irregular surfaces. [ABSTRACT FROM AUTHOR]