1. Atom Probe Tomography for Catalysis Applications: A Review.
- Author
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Barroo, Cédric, Akey, Austin J., and Bell, David C.
- Subjects
ATOM-probe tomography ,FOCUSED ion beams ,CATALYSIS ,CHEMICAL sample preparation ,THREE-dimensional imaging - Abstract
Atom probe tomography is a well-established analytical instrument for imaging the 3D structure and composition of materials with high mass resolution, sub-nanometer spatial resolution and ppm elemental sensitivity. Thanks to recent hardware developments in Atom Probe Tomography (APT), combined with progress on site-specific focused ion beam (FIB)-based sample preparation methods and improved data treatment software, complex materials can now be routinely investigated. From model samples to complex, usable porous structures, there is currently a growing interest in the analysis of catalytic materials. APT is able to probe the end state of atomic-scale processes, providing information needed to improve the synthesis of catalysts and to unravel structure/composition/reactivity relationships. This review focuses on the study of catalytic materials with increasing complexity (tip-sample, unsupported and supported nanoparticles, powders, self-supported catalysts and zeolites), as well as sample preparation methods developed to obtain suitable specimens for APT experiments. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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