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Synopsis We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.

Unraveling the origin of ultrafast demagnetization in multisublattice ferromagnetic materials requires femtosecond x-ray techniques to trace the magnetic moment dynamics on individual elements, but this could not yet be achieved in the hard x-ray regime. We demonstrate here the first ultrafast demagnetization dynamics in the ferromagnetic heavy 5d-transition metal Pt using circularly-polarized hard x-rays at an x-ray free electron laser (XFEL). The decay time of laser-induced demagnetization of L10-FePt is determined to be τ Pt = 0.61 ± 0.04 ps using time-resolved x-ray magnetic circular dichroism at the Pt L3 edge, whereas magneto-optical Kerr measurements indicate the decay time for the total magnetization as τ total < 0.1 ps . A transient magnetic state with a photo-modulated ratio of the 3d and 5d magnetic moments is demonstrated for pump–probe delays larger than 1 ps. We explain this distinct photo-modulated transient magnetic state by the induced-moment behavior of the Pt atom and the x-ray probing depth. Our findings pave the way for the future use of XFELs to disentangle atomic spin dynamics contributions.

Time-resolved hard x-ray photoelectron spectroscopy (trHAXPES) is established using the x-ray free-electron laser SACLA. The technique extends time-resolved photoemission into the hard x-ray regime and, as a core-level spectroscopy, combines element and atomic-site specificity and sensitivity to the chemical environment with femtosecond time resolution and bulk (sub-surface) sensitivity. The viability of trHAXPES using 8 keV x-ray free-electron-laser radiation is demonstrated by a systematic investigation of probe and pump pulse-induced vacuum space-charge effects on the V 1s emission of VO2 and the Ti 1s emission of SrTiO3. The time and excitation energy dependencies of the measured spectral shifts and broadenings are compared to the results of N-body numerical simulations and simple analytic (mean-field) models. Good agreement between the experimental and calculated results is obtained. In particular, the characteristic temporal evolution of the pump pulse-induced spectral shift is shown to provide an effective means to determine the temporal overlap of pump and probe pulses. trHAXPES opens a new avenue in the study of ultrafast atomic-site specific electron and chemical dynamics in materials and at buried interfaces.

We developed a diagnostic system for measuring the arrival timing between femtosecond X-ray free-electron laser (XFEL) and near-infrared laser pulses with high efficiency. The ultrafast change in optical transmittance induced by intense XFEL light was probed by a spatial decoding technique. For enhancing detection efficiency, we utilized an X-ray elliptical mirror that increases X-ray intensity by forming a line-focused profile. We found that the system is applicable to the timing diagnostics for 12 keV X-ray pulses with a pulse energy as small as 12 µJ.

A beamline for the x-ray free electron laser (XFEL) of SPring-8 Angstrom Compact free electron LAser (SACLA) provides hard x-ray pulses in the range 4.5–19.5 keV. Its optical system in an optics hutch delivers a pink beam below 15 keV with either of two double-mirror systems or a monochromatic beam with a double-crystal monochromator. These XFEL beams are used for various types of measurement at experimental stations, e.g. x-ray diffraction, coherent diffraction imaging, x-ray spectroscopy and pump-and-probe measurement. The experimental stations consist of experimental hutches and control stations, and a femtosecond optical laser which is synchronized with XFEL pulses. Photon diagnostics have been performed for measuring radiation parameters in a shot-by-shot manner.

We investigated the surface photochemistry of the π-complex type weakly adsorbed ethylene on Si(100)c(4×2) at 50 K, using high-resolution electron energy loss spectroscopy, quadrupole mass spectrometry, and photoelectron spectroscopy. At 50 K, both π-complex precursor and di-σ species coexist. We found that both the photoreaction from the π-complex precursor to the di-σ chemisorption and the photodesorption of ethylene occur upon photoirradiation. From the photodesorption signal of ethylene, we estimated the total cross section including these two photoinduced processes to be 1.1 ×10-17 cm2 at 365 nm. From the electronic structure of the adsorption system obtained in this study, we propose that a temporary negative ion of π-bonded ethylene formed by a photogenerated hot-electron from the Si substrate is related to these processes.