37 results on '"Suzuki, Ryoichi"'
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2. Formation of silver particles for SERS spectroscopy by mist chemical vapor deposition method
3. Gettering of Cu in self-ion irradiated silicon studied by positron annihilation spectroscopy
4. Time-resolved positron annihilation spectroscopy study of relaxation dynamics of ion damage in fused quartz
5. Characterization of Porous Structures in Advanced Low-k Films with Thin TaN Layers Using Monoenergetic Positron Beams
6. Positron Annihilation Spectroscopy on Nitride-Based Semiconductors
7. Vacancy-Type Defects Introduced by Gas Cluster Ion-Implantation on Si Studied by Monoenergetic Positron Beams
8. Slow Positron Beam Apparatus for Surface and Subsurface Analysis of Samples in Air
9. Characterization of Low-k/Cu Damascene Structures Using Monoenergetic Positron Beams
10. Positron Trapping Sites Originating from Oxide Interfaces on 4H-SiC C(0001)- and Si(0001)-Faces
11. Characterization of Metal/High-kStructures Using Monoenergetic Positron Beams
12. Defects in Electroplated Cu and Their Impact on Stress Migration Reliability Studied using Monoenergetic Positron Beams
13. Reemission of Positrons from Mesh and Powder Moderators
14. Low-k SiOCH Film Deposited by Plasma-Enhanced Chemical Vapor Deposition Using Hexamethyldisiloxane and Water Vapor
15. Fabrication of Microparticle Layer by Annealing Microparticle/Polymer Composite
16. Characterization of Hf0.3Al0.7OxFabricated by Atomic-Layer-Deposition Technique Using Monoenergetic Positron Beams
17. Characterizing Metal-Oxide Semiconductor Structures Consisting of HfSiOx as Gate Dielectrics using Monoenergetic Positron Beams
18. Properties of Low-kCu Barrier SiOCNH Film Deposited by Plasma-Enhanced Chemical Vapor Deposition using Hexamethyldisiloxane and Ammonia Gases
19. Pore Characteristics of Low-Dielectric-Constant Films Grown by Plasma-Enhanced Chemical Vapor Deposition Studied by Positron Annihilation Lifetime Spectroscopy
20. Oxygen-Related Defects Introduced by As+-Implantation through Cap Layers in Si Probed by Monoenergetic Positron Beams
21. Control of Intrinsic Defects in CuInSe2 Films for Device Applications
22. Investigation of Positron Moderator Materials for Electron-Linac-Based Slow Positron Beamlines
23. Defects in Ion Implanted Hg0.78Cd0.22Te Probed by Monoenergetic Positron Beams
24. Investigation of Vacancy-Type Defects in P+-Implanted 6H-SiC Using Monoenergetic Positron Beams
25. Annealing Properties of Defects in Ion-Implanted 3C-SiC Studied Using Monoenergetic Positron Beams
26. Annealing Properties of Defects in B+- and F+-Implanted Si Studied Using Monoenergetic Positron Beams
27. Fluorine-Related Defects in BF2 +-Implanted Si Probed by Monoenergetic Positron Beams
28. Effects of Recoil-Implanted Oxygen on Depth Profiles of Defects and Annealing Processes in P+-Implanted Si Studied Using Monoenergetic Positron Beams
29. Defects in TiN Films Probed by Monoenergetic Positron Beams
30. Raman Spectroscopy and Positron Lifetime Studies of Structural Relaxation and Defect Evolution in Amorphous Silicon
31. Vacancy-Type Defects in Ion-Implanted Diamonds Probed by Monoenergetic Positron Beams
32. Defects in Heavily Phosphorus-Doped Si Epitaxial Films Probed by Monoenergetic Positron Beams
33. Lasing at 352 nm of the NIJI-IV Storage-Ring Free-Electron Laser
34. Characterization of Separation-by-Implanted-Oxygen Wafers with Monoenergetic Positron Beams
35. Characterization of Diamond Films by Means of a Pulsed Positron Beam
36. Characterization of Hydrogenated Amorphous Silicon Films by a Pulsed Positron Beam
37. Slow Positron Pulsing System for Variable Energy Positron Lifetime Spectroscopy
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