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The effect of oxidizing agents on the electrical properties of ferrite CoFe2O4, synthesized by a wet chemical method, was studied. The dielectric properties of ferrites in the presence and absence of oxidizing agents, namely H2O2 and KMnO4, were investigated. X-ray diffraction patterns were indexed by Rietveld refinement to evaluate unit cell dimensions and to confirm the formation of single phase cobalt ferrite. The transmission electron microscopy (TEM) image confirmed that the particles possess cubic morphology. Particle size changes slightly from 30 to 35?nm on the addition of various oxidizing agents. The dielectric constant and the dielectric loss tangent were observed to increase with increasing the oxidizing power of the reagent added.