37 results on '"Massa E"'
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2. Measurement of miscut angles in the determination of Si lattice parameters
3. Non-invasive characterization of the pigment’s palette used on the painted tomb slabs at Paestum archaeological site
4. Forensic Imaging for Art Diagnostics. What Evidence Should We Trust?
5. Gravity and anisotropy effects in the volume determination of Si spheres for the kilogram realisation
6. Bayesian model selection applied to linear regressions with weighted data
7. Wavefront errors in a two-beam interferometer
8. Results of diagnostic campaign promoted by AIAr in the deposits of the Archaeological Museum of Paestum
9. Self-weight effect in the measurement of the volume of silicon spheres
10. Forward scattering in two-beam laser interferometry
11. Avogadro constant measurements using enriched28Si monocrystals
12. A new28Si single crystal: counting the atoms for the new kilogram definition
13. A new analysis for diffraction correction in optical interferometry
14. Improved measurement results for the Avogadro constant using a28Si-enriched crystal
15. The watt-balance operation: a continuous model of the coil interaction with the magnetic field
16. An automated resistor network to inspect the linearity of resistance-thermometry measurements
17. A finite element analysis of surface-stress effects on measurement of the Si lattice parameter
18. The watt-balance operation: magnetic force and induced electric potential on a conductor in a magnetic field
19. Elemental characterization of the Avogadro silicon crystal WASO 04 by neutron activation analysis
20. Model selection in the average of inconsistent data: an analysis of the measured Planck-constant values
21. The lattice parameter of the28Si spheres in the determination of the Avogadro constant
22. The self-weight deformation of an x-ray interferometer
23. Measurement of the {2 2 0} lattice-plane spacing of a28Si x-ray interferometer
24. Counting the atoms in a28Si crystal for a new kilogram definition
25. Measurement of the lattice parameter of a silicon crystal
26. Comparison of the INRIM and PTB lattice-spacing standards
27. Measurement repetitions of the Si(220) lattice spacing
28. Retrieval of the phase profile of digitized interferograms
29. A two-axis tip tilt platform for x-ray interferometry
30. Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography
31. Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals
32. A two-axis tiptilt platform for x-ray interferometry.
33. Measurement of the {2 2 0} lattice-plane spacing of a 28Si x-ray interferometer.
34. Counting the atoms in a 28Si crystal for a new kilogram definition.
35. The lattice parameter of the 28Si spheres in the determination of the Avogadro constant.
36. Measurement repetitions of the Si (220) lattice spacing.
37. Measurement repetitions of the Si(220) lattice spacing.
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