11 results on '"Maegawa, Shigeto"'
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2. Analysis of Hot Carrier Degradation of Lateral Double-Diffused Metal–Oxide–Semiconductor under Gate Pulse Stress
3. Novel Design of Vertical Double-Diffused Metal–Oxide–Semiconductor Transistor for High Electrostatic Discharge Robustness
4. High Soft-Error Tolerance Body-Tied Silicon-on-Insulator Technology with Partial Trench Isolation
5. Improvement of Surface Morphology of Epitaxial Silicon Film for Elevated Source/Drain Ultrathin Silicon-on-Insulator Complementary-Metal-Oxide-Semiconductor Devices
6. Direct Measurement of Transient Drain Currents in Partially-Depleted SOI N-Channel MOSFETs Using a Nuclear Microprobe for Highly Reliable Device Designs
7. Analyses of the Radiation-Caused Characteristics Change in SOI MOSFETs Using Field Shield Isolation
8. The Influence of the Buried Oxide Defects on the Gate Oxide Reliability and Drain Leakage Currents of the Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors
9. Impact of µA-ON-Current Gate-All-Around TFT (GAT) for Static RAM of 16Mb and beyond
10. A 0.4 µm Gate-All-Around TFT (GAT) Using a Dummy Nitride Pattern for High-Density Memories
11. Brillouin Scattering in Layered Semiconductors using Microprocessor-controlled Fabry-Perot Interferometer
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