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1. Bulk-fin field-effect transistor-based capacitorless dynamic random-access memory and its immunity to the work-function variation effect

Author

Lee, Sang Ho, primary, Park, Jin, additional, Kim, Geon Uk, additional, Kang, Ga Eon, additional, Heo, Jun Hyeok, additional, Jeon, So Ra, additional, Yoon, Young Jun, additional, Seo, Jae Hwa, additional, Jang, Jaewon, additional, Bae, Jin-Hyuk, additional, Lee, Sin-Hyung, additional, and Kang, In Man, additional

Published
2023
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