9 results on '"Horiguchi, N."'
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2. Can we optimize the gate oxide quality of DRAM input/output pMOSFETs by a post-deposition treatment?
3. Low-Frequency Noise Assessment of Work Function Engineering Cap Layers in High-κ Gate Stacks.
4. Study of the Intrinsic Limitations of the Contact Resistance of Metal/Semiconductor Interfaces through Atomistic Simulations.
5. Low Frequency Noise Analysis of Impact of Metal Gate Processing on the Gate Oxide Stack Quality.
6. Processing Technologies for Advanced Ge Devices.
7. Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
8. Non-equilibrium dynamics in Mott-to-superfluid transition in Bose-Einstein condensation in optical lattices
9. Low-Frequency-Noise-Based Oxide Trap Profiling in Replacement High-κ/Metal-Gate pMOSFETs.
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