1. Serial snapshot crystallography for materials science with SwissFEL
- Author
-
Dejoie, Catherine, Smeets, Stef, Baerlocher, Christian, Tamura, Nobumichi, Pattison, Philip, Abela, Rafael, McCusker, Lynne B., Laboratory of Crystallography [ETH Zürich], Department of Materials [ETH Zürich] (D-MATL), Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich)- Eidgenössische Technische Hochschule - Swiss Federal Institute of Technology [Zürich] (ETH Zürich), Lawrence Berkeley National Laboratory [Berkeley] (LBNL), Ecole Polytech Fed Lausanne, Crystallog Lab, CH-1015 Lausanne, Switzerland, European Synchrotron Radiation Facility (ESRF), and Paul Scherrer Inst, SwissFEL, CH-5232 Villigen, Switzerland
- Subjects
Diffraction ,Materials science ,Astrophysics::High Energy Astrophysical Phenomena ,multi-microcrystal diffraction ,Small unit ,Atomic ,Biochemistry ,law.invention ,Inorganic Chemistry ,Particle and Plasma Physics ,Structural Biology ,law ,[CHIM]Chemical Sciences ,Nuclear ,General Materials Science ,Physical and Theoretical Chemistry ,lcsh:Science ,serial snapshot crystallography ,XFEL ,Free-electron laser ,Single shot ,Molecular ,Serial snapshot crystallography ,Multi-microcrystal diffraction ,Indexing ,Broad-bandpass beam ,General Chemistry ,Condensed Matter Physics ,Research Papers ,broad-bandpass beam ,Synchrotron ,Crystallography ,Femtosecond ,Physics::Accelerator Physics ,Snapshot (computer storage) ,lcsh:Q ,indexing ,Physical Chemistry (incl. Structural) - Abstract
New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-energy-bandpass mode of the SwissFEL beam show that it will be possible to record a diffraction pattern of up to 10 randomly oriented crystals in a single snapshot, to index the resulting reflections, and to extract their intensities reliably. The crystals are destroyed with each XFEL pulse, but by combining snapshots from several sets of crystals, a complete set of data can be assembled, and crystal structures of materials that are difficult to analyze otherwise will become accessible. Even with a single shot, at least a partial analysis of the crystal structure will be possible, and with 10–50 femtosecond pulses, this offers tantalizing possibilities for time-resolved studies., IUCrJ, 2 (3), ISSN:2052-2525
- Published
- 2015