1. Investigation Into Microwave Power Dependence of High Quality Tl-1223 Thin Films on LSAT Substrate
- Author
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Yasumoto Tanaka, Janina Mazierska, A. Sundaresan, and Mohan V. Jacob
- Subjects
Materials science ,Analytical chemistry ,Sapphire ,Dielectric resonator ,Substrate (electronics) ,Electrical and Electronic Engineering ,Atmospheric temperature range ,Thin film ,Condensed Matter Physics ,Epitaxy ,Sheet resistance ,Electronic, Optical and Magnetic Materials ,Amorphous solid - Abstract
The microwave power dependence of high quality Tl(Ba,Sr)/sub 2/Ca/sub 2/Cu/sub 3/O/sub y/ thin films grown on 1'' diameter LSAT substrates using the Amorphous Phase Epitaxy method has been investigated in this paper. We have performed surface resistance (R/sub S/) measurements of Tl-1223 thin films on LSAT using the Hakki-Coleman sapphire dielectric resonator technique in the temperature range 15-94 K. High accuracy in measurements was achieved by using the multi-frequency Transmission Mode Q-Factor Technique. The Tl-1223 films exhibited low surface resistance comparable to YBCO films. When RF power levels were increased the onset of nonlinearity was observed at 0 dBm for all measured temperatures (17, 50, 70 and 84 K).
- Published
- 2005