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Many established terahertz imaging modalities are on one side restricted by the tradeoff between resolution and field of view such as in the case of focal plane arrays and on the other side suffer from a limited depth of field such as in the case of quasi-optical terahertz imaging configurations. Furthermore, typical scanning solutions require time-consuming measurement procedures and restrict significant potential industrial deployments of terahertz imaging technology. Imaging with sparse multistatic line arrays in combination with digital beam forming (DBF) techniques enables us to overcome these limitations and offer three-dimensional (3D) terahertz image reconstructions of the object. This contribution addresses the design of such terahertz imaging systems from a general point of view with the focus on the design of sparse line arrays, while considering objects scattering properties. Based on this design concept, the realization of a novel highly sparse 3D terahertz imaging system is discussed. The sparse line array of the system is operating within a frequency range from 75 to 110 GHz and is used in combination with a conveyor in order to generate a synthetic sampling aperture. The system is capable to generate 3D terahertz images with tens of megavoxels at feed motions of up to a few 10 cm/s. Also, a sparse array design in regard to an imaging system operating at 240 GHz with integrated SiGe sensor elements is discussed. In addition, three different DBF algorithms are compared in regard to their computational efficiency.

We present a simulation and data-processing framework that incorporates full 3-D configuration, simulation, and reconstruction functionalities for hybrid synthetic aperture THz systems, which combine mechanically scanned real imaging projection (1-D) and synthetic imaging reconstruction (2-D). The simulation is based on a ray-casting approach including models for reflections at rough surfaces and angular antenna sensitivity. A near real-time GPU reconstruction is introduced to process large amounts of data in parallel. Techniques for fast fusion of reconstructed data from several acquisition directions are presented. They serve as basis to visualize a fully consistent 3-D object. The modular framework allows a fast, easy, and efficient evaluation and prediction of system properties including scattering behavior for these types of scanner setups.

This paper presents the research and development of two terahertz imaging systems based on photonic and electronic principles, respectively. As part of this study, a survey of ongoing research in the field of terahertz imaging is provided focusing on security applications. Existing terahertz imaging systems are reviewed in terms of the employed architecture and data processing strategies. Active multichannel measurement method is found to be promising for real-time applications among the various terahertz imaging techniques and is chosen as a basis for the imaging instruments presented in this paper. An active system operation allows for a wide dynamic range, which is important for image quality. The described instruments employ a multichannel high-sensitivity heterodyne architecture and aperture filling techniques, with close to real-time image acquisition time. In the case of the photonic imaging system, mechanical scanning is completely obsolete. We show 2-D images of simulated 3-D image data for both systems. The reconstruction algorithms are suitable for 3-D real-time operation, only limited by mechanical scanning.

We give an overview over several all-optoelectronic measurement systems which we have developed for transmittive and reflective imaging in the terahertz (THz) frequency range. The systems employ either pulsed or continuous-wave THz radiation. In both cases, they work on the basis of single-pixel scanning. Addressing the potential for imaging in the medical and dental field, and the application of THz radiation for industrial surface and interface characterization, we explore dark-field imaging where the imaging contrast originates from diffraction and scattering effects coming from topography or refractive-index variations.