1. Efficient mode-matching analysis of discontinuities in finite planar substrates using perfectly matched layers
- Author
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S. Van den Berghe, Frank Olyslager, D. De Zutter, and H. Derudder
- Subjects
Reflection (mathematics) ,Planar ,Optics ,Materials science ,Perfectly matched layer ,Scattering ,business.industry ,Finite-difference time-domain method ,Substrate (printing) ,Electrical and Electronic Engineering ,Classification of discontinuities ,business ,Monolithic microwave integrated circuit - Abstract
A new method to determine the reflection of substrate modes in finite substrate planar circuits is proposed. The perfectly matched layer (PML) concept is used to transform the open problem into a closed one. The discrete set of substrate, evanescent, and Berenger modes of the resulting anisotropic waveguides are then used in a mode-matching scheme to deduce the scattering coefficients of the substrate modes for oblique incidence on the edge of the substrate. We show results for single- and double-layered substrates and compare with finite-difference time-domain (FDTD) results. The combined perfectly matched layer (PML) mode-matching technique turns out to be very efficient.
- Published
- 2001
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