6 results on '"Rooyackers, R."'
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2. Impact of Line-Edge Roughness on FinFET Matching Performance
3. Stress Hybridization for Multigate Devices Fabricated on Supercritical Strained-SOI (SC-SSOI)
4. Performance improvement of tall triple gate devices with strained SiN layers
5. Gate-source-drain architecture impact on DC and RF performance of sub-100-nm elevated source/drain NMOS transistors
6. Elevated source/drain by sacrificial selective epitaxy for high performance deep submicron CMOS: Process window versus complexity
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