8 results on '"Lin, Jia-Hong"'
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2. Improving Hot Carrier Reliability of Organic-TFTs by Extended Electrode
3. Investigation of Threshold Voltage and Drain Current Degradations in Si$_{\text{3}}$N$_{\text{4}}$/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
4. Reliability Enhancement by Doping Boron and Fluorine in Lightly Doped Drain Region of High-Voltage FinFET
5. Abnormal On Current Tendency in Saturation Region between High and Light Carbon Doped buffer layer in p-GaN HEMT
6. Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
7. Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes
8. Corrections to “Agent-Based Control Framework for Mass Customization Manufacturing With UHF RFID Technology”
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