8 results on '"Kuo, Hung-Ming"'
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2. Analysis of Abnormal $\textit{C}$–$\textit{V}$ Hump on Si$_{\text{3}}$N$_{\text{4}}$ MIS-HEMT With Mesa Isolation Under Negative Gate Bias Stress
3. Investigation of Threshold Voltage and Drain Current Degradations in Si$_{\text{3}}$N$_{\text{4}}$/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
4. Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-$\mu$m Bipolar-CMOS-DMOS Technology
5. Reliability Enhancement by Doping Boron and Fluorine in Lightly Doped Drain Region of High-Voltage FinFET
6. Defect Passivation and Reliability Enhancement by Low-Temperature-High-Pressure Hydrogenation in LDMOS with 0.13-μm Bipolar-CMOS-DMOS Technology
7. Abnormal On Current Tendency in Saturation Region between High and Light Carbon Doped buffer layer in p-GaN HEMT
8. Abnormal On-Current Degradation Under Non-Conductive Stress in Contact Field Plate Lateral Double-Diffused Metal-Oxide- Semiconductor Transistor With 0.13-μm Bipolar-CMOS-DMOS Technology
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