1. Parametric Characterization of TES Detectors Under DC Bias
- Author
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Enectali Figueroa-Feliciano, James A. Chervenak, Fred M. Finkbeiner, Wonsik Yoon, Aaron M. Datesman, John E. Sadleir, Meng P. Chiao, Megan E. Eckart, Caroline A. Kilbourne, Gabriele L. Betancourt-Martinez, Richard L. Kelley, Frederick S. Porter, Joseph S. Adams, Stephen J. Smith, Sang Jun Lee, Maurice A. Leutenegger, Simon R. Bandler, Edward J. Wassell, and Audrey J. Ewin
- Subjects
Physics ,Spectrometer ,Physics::Instrumentation and Detectors ,business.industry ,Detector ,Astrophysics::Instrumentation and Methods for Astrophysics ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,Temperature measurement ,Electronic, Optical and Magnetic Materials ,Magnetic field ,Thermal conductivity ,Operating temperature ,0103 physical sciences ,Electrical and Electronic Engineering ,Aerospace engineering ,010306 general physics ,0210 nano-technology ,business ,DC bias ,Parametric statistics - Abstract
The X-ray integrated field unit (X-IFU) in European Space Agency's (ESA's) Athena mission will be the first high-resolution X-ray spectrometer in space using a large-format transition-edge sensor microcalorimeter array. Motivated by optimization of detector performance for X-IFU, we have conducted an extensive campaign of parametric characterization on transition-edge sensor (TES) detectors with nominal geometries and physical properties in order to establish sensitivity trends relative to magnetic field, dc bias on detectors, operating temperature, and to improve our understanding of detector behavior relative to its fundamental properties such as thermal conductivity, heat capacity, and transition temperature. These results were used for validation of a simple linear detector model in which a small perturbation can be introduced to one or multiple parameters to estimate the error budget for X-IFU. We will show here results of our parametric characterization of TES detectors and briefly discuss the comparison with the TES model.
- Published
- 2017