6 results on '"Dunne, Greg"'
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2. Trap and Inversion Layer Mobility Characterization Using Hall Effect in Silicon Carbide-Based MOSFETs With Gate Oxides Grown by Sodium Enhanced Oxidation
3. Time-Dependent Dielectric Breakdown of 4H-SiC/$ \hbox{SiO}_{2}$ MOS Capacitors
4. DC and Transient Performance of 4H-SiC Double-Implant MOSFETs
5. Time-Dependent Dielectric Breakdown of 4H-SiC MOS Capacitors and DMOSFETs
6. Electron-Scattering Mechanisms in Heavily Doped Silicon Carbide MOSFET Inversion Layers
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