1. A Talbot–Lau X-Ray Deflectometer as a High-Energy Density Plasma Diagnostic
- Author
-
Jake Bromage, Ildar A. Begishev, Sean Regan, M. P. Valdivia, Dan Stutman, Chad Mileham, and Christian Stoeckl
- Subjects
010302 applied physics ,Physics ,Nuclear and High Energy Physics ,Electron density ,business.industry ,Astrophysics::High Energy Astrophysical Phenomena ,Attenuation ,Plasma ,Condensed Matter Physics ,Laser ,01 natural sciences ,law.invention ,010309 optics ,Interferometry ,Planar ,Optics ,law ,0103 physical sciences ,Plasma diagnostics ,business ,Image resolution - Abstract
We present the development and advancement of the Talbot–Lau X-ray deflectometry (TXD) single-image phase-retrieval technique, for high-energy density (HED) plasma diagnostics. The Talbot–Lau interferometer has been benchmarked as an electron density diagnostic for low- $Z$ objects ( $Z ) at the X-ray energies of 8 and 17 keV. A laser driven X-ray backlighter was used at the multi-tera watt laser facility in order to obtain electron density measurements. We measured X-ray refraction and retrieved sharp and smooth density gradients with source-limited spatial resolution. Since TXD can use extended, incoherent, line, or continuum X-ray sources, a wide range of X-ray backlighters can be used, driven from laser or pulsed power systems. Laboratory results indicate potential for simultaneous retrieval of: electron density maps through refraction and attenuation, material mixing through elemental composition, and instabilities through scatter images. Experiments using a 17-keV backlighter to characterize a planar shock are planned to test the TXD technique on an HED plasma environment.
- Published
- 2016