1. A heavy-ion tolerant clock and data recovery circuit for satellite embedded high-speed data links
- Author
-
Lapuyade, H., Mazouffre, O., Goumballa, B., Pignol, M., Malou, F., Neveu, C., Pouget, V., Deval, Y., and Begueret, J. B.
- Subjects
Heavy ions -- Influence ,Ionizing radiation -- Influence ,Electronic circuits -- Properties ,Electronic circuits -- Testing ,Complementary metal oxide semiconductors -- Properties ,Complementary metal oxide semiconductors -- Testing ,Business ,Electronics ,Electronics and electrical industries - Abstract
A clock and data recovery (CDR) circuit dedicated to satellite embedded high-speed data links is implemented in a 0.13 [micro]m CMOS technology. Its radiation hardening is obtained thanks to an innovative architecture based on an injection-locked oscillator (ILO) associated with a phase-alignment circuit. Its low single-event transient (SET) sensitivity is shown thanks to heavy-ion and laser testing. Index Terms--Clock and data recovery (CDR), CMOS technology, heavy-ion testing, high-speed data links, injection-locked oscillators (ILO), laser testing, radiation hardening by design, single-event transients (SET).
- Published
- 2007