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Your search keyword '"Arisawa, S."' showing total 4 results
Start Over Author "Arisawa, S." Publisher institute of electrical and electronics engineers, inc.
4 results on '"Arisawa, S."'

1. Growth of electron-doped superconductor [Pr.sub.0.9]La[Ce.sub.0.1]Cu[O.sub.4] films and their applications to intrinsic Josephson junctions

Author

Jie Yuan, Huabing Wang, Iguchi, I., Yungyuan Hsu, Arisawa, S., Ishii, A., and Hatano, T.

Subjects
Cerium -- Electric properties, Cerium -- Magnetic properties, Josephson junction -- Design and construction, Lanthanum -- Electric properties, Lanthanum -- Magnetic properties, Ablation (Vaporization technology) -- Usage, Transition temperature -- Evaluation, Praseodymium -- Electric properties, Praseodymium -- Magnetic properties, Strontium -- Electric properties, Strontium -- Magnetic properties, Superconductivity -- Analysis, Business, Electronics, Electronics and electrical industries
Published
2009

2. Exploring the versatility of double-sided fabrication of intrinsic Josephson junctions

Author

H.B. Wang, T. Hatano, S. Urayama, S.M. Kim, K. Inomata, Y. Takano, M. Nagao, Muller, P., A. Ishii, P.H. Wu, Arisawa, S., M. Tachiki, and T. Yamashita

Subjects
Integrated circuit fabrication -- Methods, Terahertz radiation -- Analysis, Josephson junction -- Design and construction, Integrated circuit fabrication, Business, Electronics, Electronics and electrical industries
Abstract

Various types of intrinsic Josephson junctions (IJJs) are fabricated using a double-sided process from BSCOO-2212 single crystals. The potential applications of IJJs as high frequency detectors or generators at terahertz region are demonstrated.

Published
2005

4. Stress induced change in hole concentration in superlattice films of bismuth-based oxide superconductors

Author

Hatano, T., Labat, S., Ishii, A., Arisawa, S., and Togano, K.

Subjects
High temperature superconductivity -- Research, High temperature superconductors -- Analysis, Metallic films -- Analysis, Thin films, Multilayered -- Analysis, Business, Electronics, Electronics and electrical industries
Abstract

A study investigated the (2234)1(2212)1 and (2245)1(2201)1 superlattice films of bismuth-based oxide superconductors by X-ray diffraction especially in-plane. It reports the impact of the change in in-plane lattice constants by the superlattice formation which would lead to the transfer of the holes from the over-doped unit to the under-doped unit. It is suggested that stress might induce the charge transfer from the over-doped layers to the under-doped layers such that the stress in both over-doped and under-doped unit might be released.

Published
1999

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