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A new jitter model is developed using Matlab and Spice to analyze data dependent jitter (DDJ) in serial data integrated circuits. The simulation results show that DDJ is dependent on the data pattern, data rate, and data slew as well as frequency bandwidth, impedance mismatch, and loss of the datapath of integrated circuits. This paper presents the effect of the DDJ on other jitter subcomponents, which is essential to analysis and characterization of DDJ.

This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in automatic test equipment (ATE). The separate components are analyzed individually and then combined using Matlab. The Matlab simulation shows how jitter components combine and how the total jitter depends on the jitter injection sequence. The relationship among jitter components is presented and the superposition of the jitter components is verified. This new technique gives test engineers an insight into how the jitter components interact.