1. A new evaluation and control method on semiconductor risk production manufacturing period
- Author
-
Hongtao H T Qian and Ziqian Javaer Liu
- Subjects
Engineering ,Order management system ,Reliability (semiconductor) ,Automatic control ,business.industry ,Production (economics) ,business ,Control methods ,Risk management ,Risk evaluation ,Reliability engineering - Abstract
In this paper, an enhanced risk evaluation and control method on semiconductor Risk Start Agreement (RSA) phase, a risk production period, is reported. Firstly, this method creates a reliability risk evaluation model which defines 5 risk levels with maximal allowed wafer start quantity on RSA phase according to tested data. Then, we also optimize multi-systems (RSA and Order Management System (OMS)) to realize systematical and automatic control on different risk levels. Over 4 years' practice shows this method can be well used in risk management on semiconductor risk production period.
- Published
- 2016
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