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13. Wove paper analysis through texture similarities

34. A 45 nm CMOS node Cu/Low-k/ Ultra Low-k PECVD SiCOH (k=2.4) BEOL Technology

41. Log Wavelet Leaders Cumulant Based Multifractal Analysis of EVI fMRI Time Series: Evidence of Scaling in Ongoing and Evoked Brain Activity.

42. Bootstrap for Empirical Multifractal Analysis.

43. Enhanced Reliability of Hard Disk Drive by Vapor Corrosion Inhibitor.

46. Properties of SrBi/sub 2/Ta/sub 2/O/sub 9/ thin films grown by MOCVD for high density FeRAM applications

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