1. Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics
- Author
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Aziouz Chabane, Stéphane Darbon, Adrien Rousseau, G. Pien, Paola Cervantes, Marc Gaillardin, Vladimir Glebov, Melanie Raine, Olivier Duhamel, Sylvain Girard, P. Paillet, Vincent Goiffon, Pierre Magnan, J.-L. Bourgade, Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE), Université Jean Monnet - St Etienne (FRANCE), University of Rochester (USA), Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France), DAM Île-de-France (DAM/DIF), Direction des Applications Militaires (DAM), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut Supérieur de l'Aéronautique et de l'Espace (ISAE-SUPAERO), Laboratoire Hubert Curien (LHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), Laboratory for lasers energetics - LLE (New-York, USA), and University of Rochester [USA]
- Subjects
Nuclear and High Energy Physics ,Astrophysics::High Energy Astrophysical Phenomena ,ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION ,Hardware_PERFORMANCEANDRELIABILITY ,Single-event transient (SET) ,CMOS Image Sensor (CIS)- Geant4 ,Neutron ,Electrical and Electronic Engineering ,Image sensor ,Inertial confinement fusion ,Physics ,Neutrons ,Fusion ,Inertial confinement fusion (ICF) ,Pixel ,business.industry ,Gamma ray ,Micro et nanotechnologies/Microélectronique ,Nuclear Energy and Engineering ,CMOS ,Active pixel sensor (APS) ,Displacement damage dose (DDD) ,Hardening (metallurgy) ,[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic ,Optoelectronics ,Dark current distribution ,business - Abstract
International audience; A hardening method is proposed to enable the use of CMOS image sensors for Fusion by Inertial Confinement Diagnostics. The mitigation technique improves their radiation tolerance using a reset mode implemented in the device. The results obtained evidence a reduction of more than 70% in the number of transient white pixels induced in the pixel array by the mixed neutron and $gamma$ -ray pulsed radiation environment.
- Published
- 2013
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