14 results on '"Smith, Brad"'
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2. Procedure for Controlling Pad Scrub During High-Temperature Wafer Probing
3. Calibration of CBCM Measurement Hardware
4. A Study of Power Supply Stability in Ring Oscillator Structures
5. Test structures to evaluate the impact of parasitic edge FET on circuits operating in weak inversion
6. Test structure to evaluate the impact of neighboring features on stress of metal interconnects
7. Session 5: Process characterization
8. Calibration of library element optimization to improve static power
9. A versatile defectivity monitor designed for efficient test and failure analysis
10. A novel biasing technique for addressable parametric arrays
11. Efficient technique for Si validation of level shifters.
12. A Novel Biasing Technique for Addressable Parametric Arrays.
13. ARM and Intel Battle over the Mobile Chip's Future.
14. A Storm (Worm) Is Brewing.
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