11 results on '"Shin D.W."'
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2. The influence of IMD bake process on buried channel PMOS hot carrier reliability of advanced DRAM.
3. Robot manipulator control using recursive torque methods.
4. S-RCAT (sphere-shaped-recess-channel-array transistor) technology for 70nm DRAM feature size and beyond
5. High-density low-power-operating dram device adopting 6F/sup 2/ cell scheme with novel S-RCAT structure on 80nm feature size and beyond
6. A 0.13 μm DRAM technology for giga bit density stand-alone and embedded DRAMs
7. Magnetic field-induced deformation in single- and poly-crystalline Ni/sub 2/MnGa
8. Novel robust cell capacitor (Leaning Exterminated Ring type Insulator) and new storage node contact (Top Spacer Contract) for 70nm DRAM technology and beyond.
9. A 0.13 μm DRAM technology for giga bit density stand-alone and embedded DRAMs.
10. Magnetic field-induced deformation in single- and poly-crystalline Ni2MnGa.
11. Vibration level dependence of piezoelectric constant in PT-PZ-PCN system ceramic.
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