23 results on '"Piccirilli, Maria Cristina"'
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2. Classification of Power Quality disturbances using Multi-Valued Neural Networks and Convolutional Neural Networks
3. Smart monitoring of DC-DC converters
4. Applications of Machine Learning Techniques for the Monitoring of Electrical Transmission and Distribution lines
5. Failure Prevention in DC–DC Converters: Theoretical Approach and Experimental Application on a Zeta Converter.
6. Assessment of the health status of Medium Voltage lines through a complex neural network
7. Comparison Between PI and Neural Network Controller for Dual Active Bridge Converter
8. Pareto Optimization of Planar Circular Coil for EV Wireless Charging
9. Testability Analysis Based on Complex-Field Fault Modeling
10. Improvement of Power Flow Analysis based on Currents' Physical Component (CPC) Theory
11. MLMVNNN for Parameter Fault Detection in PWM DC–DC Converters and Its Applications for Buck and Boost DC–DC Converters.
12. System identification using FRA and a modified MLMVN with arbitrary complex-valued inputs
13. Derivation of network functions for PWM DC-DC Buck converter in DCM including effects of parasitic components on diode duty-cycle
14. Comparison of DCM operated PWM DC-DC converter modelling methods including the effects of parasitic components on duty ratio constraint
15. Multilevel DC-AC converters for renewable power generation plants: Comparison, simulation, and experimental tests
16. Effects of parasitic components on diode duty cycle and small-signal model of PWM DC-DC buck converter in DCM
17. Analog system modeling based on a double modified complex valued neural network
18. A Testability Measure for DC-Excited Periodically Switched Networks With Applications to DC-DC Converters.
19. A double neural network for interpretation of the frequency response in the electrical equipments
20. A Fast Algorithm for Testability Analysis of Large Linear Time-Invariant Networks.
21. Symbolic techniques in neural network based fault diagnosis of analog circuits
22. A Method for the Automatic Selection of Test Frequencies in Analog Fault Diagnosis.
23. A Singular-Value Decomposition Approach for Ambiguity Group Determination in Analog Circuits.
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