114 results on '"Pellish, Jonathan A."'
Search Results
2. NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results
3. Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center
4. NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results
5. Development of a Flight-Program-Ready Radiation Model-Based Assurance Platform
6. NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results
7. Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory.
8. Single-Event Transient Case Study for System-Level Radiation Effects Analysis.
9. Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory.
10. NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results
11. Compendium of Current Total Ionizing Dose and Displacement Damage Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
12. Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
13. Compendium of Single Event Effect Results from NASA Goddard Space Flight Center
14. Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center
15. Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
16. Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA
17. Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA
18. Compendium of Recent Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
19. VCSEL and Photodiode Proton Test Results for an Optical Communications Link
20. Compendium of Recent Single Event Effects for Candidate Spacecraft Electronics for NASA
21. A Comparison of High-Energy Electron and Cobalt-60 gamma-Ray Radiation Testing
22. Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA
23. Compendium of Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
24. Hardness assurance testing for proton direct ionization effects
25. Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems
26. Recent Total Ionizing Dose and Displacement Damage Compendium of Candidate Electronics for NASA Space Systems
27. Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
28. Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
29. Radiation Performance of Commercial SiGe HBT BiCMOS High Speed Operational Amplifiers
30. Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications
31. Non-TMR SEU-hardening techniques for SiGe HBT shift registers and clock buffers
32. Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements
33. Heavy ion testing at the galactic cosmic ray energy peak
34. Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
35. High Energy Neutron Multiple-Bit Upset
36. Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies.
37. Single Event Induced Multiple Bit Errors and the Effects of Logic Masking.
38. Characterizing the Effects of Single Event Upsets on Synchronous Data Paths.
39. IEEE Nuclear and Space Radiation Effects Conference: Notes on the Early Conferences.
40. Hardness Assurance Testing for Proton Direct Ionization Effects.
41. Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs.
42. 32 and 45 nm Radiation-Hardened-by-Design (RHBD) SOI Latches.
43. The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons.
44. Impact of Spacecraft Shielding on Direct Ionization Soft Error Rates for Sub-130 nm Technologies.
45. Reconciling 3-D Mixed-Mode Simulations and Measured Single-Event Transients in SiGe HBTs.
46. Mechanisms and Temperature Dependence of Single Event Latchup Observed in a CMOS Readout Integrated Circuit From 16–300 K.
47. Muon-Induced Single Event Upsets in Deep-Submicron Technology.
48. Heavy Ion Testing With Iron at 1 GeV/amu.
49. Non-TMR SEU-Hardening Techniques for SiGe HBT Shift Registers and Clock Buffers.
50. Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.