19 results on '"Meyer, M.A."'
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2. Integration Aspects of CoWP Capping Layers for Electromigration Enhancement
3. Comprehensive reliability analysis of CoWP Metal Cap unit processes for high volume production in sub-μm dimensions
4. Electromigration-induced copper interconnect degradation and failure: the role of microstructure.
5. PREDICT: a case study, using fuzzy logic.
6. Failures in copper interconnects-localization, analysis and degradation mechanisms.
7. Characterizing reliability in a product/process design-assurance program.
8. Log-Periodic Octaline Hybrid Junctions.
9. Nerve-bundle conduction velocity distribution measurement and transfer function analysis.
10. How to apply the anthropological technique of participant observation to knowledge acquisition for expert systems.
11. Sources of and effects of interexpert correlation: an empirical study.
12. An acoustoelectric transistor.
13. Applications of the Turnstile Junction.
14. Contributors (Dec. 1955 [T-MTT]).
15. Failures in copper interconnects-localization, analysis and degradation mechanisms
16. Characterizing reliability in a product/process design-assurance program
17. PREDICT: a case study, using fuzzy logic
18. Electromigration-induced copper interconnect degradation and failure: the role of microstructure
19. An acoustoelectric transistor.
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