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5 results on '"Matsukawa W"'

1. Table of Contents.

Subjects
COMPOUND semiconductors
Abstract

The table of contents for the March 2012 issue of "IEEE Transactions on Electron Devices" is presented.

Published
2012
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2. Fin-Height Effect on Poly-Si/PVD-TiN Stacked-Gate FinFET Performance.

Author

Hayashida, Tetsuro, Endo, Kazuhiko, Liu, Yongxun, O'uchi, Shin-Ichi, Matsukawa, Takashi, Mizubayashi, Wataru, Migita, Shinji, Morita, Yukinori, Ota, Hiroyuki, Hashiguchi, Hiroki, Kosemura, Daisuke, Kamei, Takahiro, Tsukada, Junichi, Ishikawa, Yuki, Yamauchi, Hiromi, Ogura, Atsushi, and Masahara, Meishoku

Subjects
GATE array circuits, FIELD-effect transistors, TITANIUM nitride, SEMICONDUCTOR etching, ELECTRICAL resistivity, SILICON epitaxy, ELECTRON mobility, PHYSICAL vapor deposition
Abstract

We compared the electrical characteristics, including mobility and on -state current Ion, of \n^+-poly-Si/PVD-TiN stacked-gate FinFETs with different fin heights Hfin. The mobility was enhanced in devices with taller fins due to increased tensile stress. However, as gate length Lg decreases, Ion for devices with tall fins becomes worse, probably due to a high parasitic resistance Rp. Furthermore, Vth variation increased with increasing Hfin due to rough etching of the fin sidewall. Process technologies for reducing Rp and etching technology that yields smooth precise profiles are essential to exploit the high performance of tall FinFETs. [ABSTRACT FROM AUTHOR]

Published
2012
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3. Pinhole SPECT of Mice Using the LumaGEM Gamma Camera.

Author

MacDonald, Lawrence R., Patt, Bradley E., Iwanczyk, Jan S., Tsui, Benjamin M.W., Wang, Yuchuan, Frey, Eric C., Wessell, Daniel E., Acton, Paul D., and Kung, Hank F.

Subjects
PHOTON emission, TOMOGRAPHY, IMAGING systems, TRANSGENIC mice
Abstract

Presents information on a study which described the LumaGEM gamma camera for acquiring single photon emission computed tomography images of transgenic mice. Materials and methods; Results and discussion; Conclusions.

Published
2001
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4. Table of Contents.

Subjects
ELECTRONICS periodicals
Abstract

The table of contents for the March 2012 issue of "IEEE Electron Device Letters," is presented.

Published
2012
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