1. A novel method for SEE validation of complex SoCs using Low-Energy Proton beams
- Author
-
Alessandra Menicucci, Gianluca Furano, Marco Ottavi, Andrea Fabbri, Francesco Di Capua, L. Campajola, Stefano Di Mascio, Tomasz Szewczyk, DI CAPUA, Francesco, Furano, G. A, Di Mascio, S. B, Szewczyk, T. A, Menicucci, A. C, Campajola, Luigi, Fabbri, A. E, Ottavi, M. B., IEEE, Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., Fabbri, A., and Ottavi, M.
- Subjects
Engineering ,Proton ,0102 computer and information sciences ,01 natural sciences ,Settore ING-INF/01 - Elettronica ,Set (abstract data type) ,Printed circuit board ,System in package ,VLSI circuits Hybrid component ,Low energy ,0103 physical sciences ,Electronic engineering ,Nanotechnology ,Electronics ,Radiation test ,Programmable logic controller ,010308 nuclear & particles physics ,business.industry ,Fault tolerance ,Microcontroller ,Engineering controlled terms: Defect ,Aerospace electronics ,010201 computation theory & mathematics ,Low-energy proton ,Real estate Engineering main heading: System-on-chip ,business ,System-in-package - Abstract
This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics.
- Published
- 2016