1. Study on Optical Properties of Micro-Modulator Through $Z$-Scanning Method
- Author
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X. B. Jiao, S. Xue, Y. F. Shen, M. Y. Chen, and Z. W. Liu
- Subjects
Optical and other properties ,Light-material interactions ,Sensors ,Applied optics. Photonics ,TA1501-1820 ,Optics. Light ,QC350-467 - Abstract
Stokes polarimeters and scanning slit optical beam profilers are used to measure the polarization properties and optical spot intensities of a laser beam, which go through the micromodulator by the Z-scanning method. The polarization properties of a S-polarized and a P-polarized light are researched. The optical intensities of laser beam are obtained for S-polarized light by the Z-scanning method. The results show that the groove films can affect the polarization properties of the P-polarized light but do not change the polarization properties of the S-polarized light. The optical spot intensity of S-polarized light can be changed with the help of groove films as the scattering effect.
- Published
- 2016
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