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We report the fabrication of novel self-biased high resolution radiation detectors achieved in n-type 4H-SiC metal-oxide-semiconductor (MOS) devices. Vertical MOS structure has been realized by pulsed laser deposition of 40 nm Y2O3 layer on 20 $\mu \text{m}$ n-type 4H-SiC epilayer followed by sputter coating a nickel gate, which revealed a record-high hole diffusion length. The MOS device exhibited a remarkable radiation detection response to 5486 keV alpha particles with a charge collection efficiency of 82% and an energy resolution of 72 keV full width at half maximum (FWHM) at zero applied bias. The hole diffusion length has been calculated to be 56 $\mu \text{m}$ using a drift-diffusion model. Such long hole diffusion length and a flat-band potential of 2.1 V, enabled to attain high efficiency and resolution in the self-biased mode. Band energy calculations indicated that the presence of Y2O3 layer may have neutralized the hole traps usually present in a metal-4H-SiC interface thereby substantially improving the hole transport. Such high performing self-biased radiation detectors fabricated on 4H-SiC are intended for applications in harsh environment space missions, wherein carrying detector power supplies as a payload becomes a critical logistic issue. The present study opens the high potential of other wide bandgap semiconductors as self-biased MOS devices as well. [ABSTRACT FROM AUTHOR]

The effect of super-cadmium neutron-induced defects on radiation detection performance of Schottky barrier diodes, fabricated on 250- $\mu \text{m}$ -thick 4H-SiC epitaxial layers with ultralow intrinsic defect concentration, has been studied. The epilayers were irradiated in a TRIGA Mark II nuclear reactor dry instrumentation tube [intrareflector irradiation system or (IRIS)] in the net neutron fluence range 1010–1013 cm−2. Current–voltage (I–V) and capacitance–voltage (C–V) characteristics revealed that the detectors irradiated up to a fluence of 1012 cm−2 maintained a Schottky diode behavior. Radiation detection measurements showed an energy resolution of 28 keV (0.5%) full-width at half-maximum (FWHM) when exposed to 5486-keV alpha particles for the epilayers irradiated up to a neutron fluence of 1011 cm−2, which broadened to 42 keV (0.8%) FWHM for a fluence of 1012 cm−2. I–V and C–V measurements revealed substantial donor compensation in the epilayer irradiated at a fluence of ~1013 cm−2; however, the detector still worked satisfactorily with an energy resolution of 76-keV (1.8%) FWHM. The degradation in the detector performance with increased neutron dose was attributed to the trapping of charge carriers in the radiation-induced trap centers. Deep-level transient spectroscopy studies in the detector irradiated with a fluence of 1010 cm−2 revealed the formation of EH5 centers along with an unidentified deep electron trap located at 1.8 eV below the conduction band edge, both usually absent in as-grown 250- $\mu \text{m}$ 4H-SiC epilayers. A drift-diffusion model of charge transport showed a degradation in hole diffusion length from 10 $\mu \text{m}$ at a neutron fluence of 1010 cm−2 to $2.6~\mu \text{m}$ at 1012 cm−2 indicating formation of hole-trap centers as well. [ABSTRACT FROM AUTHOR]

We report the fabrication of vertical metal–oxide–semiconductor (MOS) detectors with the highest energy resolution ever reported. The MOS detectors have been fabricated on 50- $\mu \text{m}$ -thick n-type 4H-SiC epitaxial layers by growing a silicon dioxide (SiO2) layer thermally prior to contact deposition. The MOS detectors exhibited leakage currents two orders of magnitude lower than that observed in a Schottky barrier detector (SBD) fabricated on similar 4H-SiC epilayers. The MOS detectors exhibited a much higher energy resolution of 0.4% compared to 0.8% observed in an SBD for 5486-keV alpha particles although both the devices showed a high charge collection efficiency (CCE) of 96% when exposed to the alpha particles. Capacitance mode deep-level transient spectroscopy (C-DLTS) revealed the presence of “lifetime killer” $\text{Z}_{\mathrm {1/2}}$ defects in similar concentrations in both the devices, and however, the corresponding capture cross section in the SBD has been observed to be one order of magnitude higher compared to the MOS detector, and instead of EH6/7 center seen in the SBD, the MOS device showed the presence of EH5 center. The higher resolution of the MOS device is attributed to the lower leakage current and difference in defect configurations observed between the two devices. The MOS detector showed a positive polarity C-DLTS peak with an activation energy of 1.22 eV, which is likely due to the nonnegligible impedance of the back contact because of the SiO2 layer. The present study opens the great potential of other wide bandgap semiconductor-based vertical MOS detectors, which can be fully depleted for high-resolution X-/ $\gamma $ -ray detection. [ABSTRACT FROM AUTHOR]

The present state-of-the-art of junction-based diamond electronic devices is limited by the challenges inherent to the synthesis of n-type layers, where the dopant itself forms defect complexes that are donor compensating centers. Recently, the fabrication of diamond Schottky p-i-n diodes (SPINDs) by chemical vapor deposition (CVD) of intrinsic diamond films followed by an n-type layer on p-type diamond substrates has been reported to demonstrate excellent diode-like behavior with high rectification factors and surface barrier height at elevated temperatures. However, due to the ultrawide bandgap of diamond and small contact area of the devices, it is challenging to characterize the defect centers that limit the performance of the SPINDs using conventional capacitance transient spectroscopy. In this article, we report the characterization of defect centers in the diamond SPINDs with a contact area of 280 $\mu \text{m}\,\,\times \,\,280\,\,\mu \text{m}$ using current transient spectroscopy (CTS), which measures thermally induced emission rates from trap centers through change in device current instead of junction capacitance. The CTS scans in the temperature range 80–800 K revealed the presence of five trap-related peaks. Results from density functional theory (DFT) calculations were used to identify the nature of the traps. While most of the detected traps were identified to be vacancy complexes coupled to phosphorus and hydrogen impurities, one trap has been identified as single carbon vacancy. Most of the phosphorus-related defect complexes were observed to be in neutral and/or negative charge states and were identified as acceptor-like states. [ABSTRACT FROM AUTHOR]

Quaternary Cd0.9Zn0.1Te1–ySey (CZTS) single crystals, a novel room-temperature nuclear radiation detector semiconductor material, have been grown using a modified vertical Bridgman method (VBM) and a traveling heater method (THM). The percentage concentration of selenium in the VBM-grown crystal was 3% and that in the THM-grown crystal was 2%. While the THM Frisch collar detector ($4.4\times 4.4\times10.7$ mm $^{3}$) produced a highly resolved pulse height spectra (PHS) with a resolution of ~1.06% for 662-keV gamma rays without any correction, the VBM-grown detector ($10\times 10\times 2$ mm $^{3}$) offered a high-energy resolution of ~2% after the application of a digital bi-parametric correction. The high-resolution performance of these detectors has been attributed to the addition of Se in the Cd0.9Zn0.1Te (CZT) matrix. Ab-initio calculations based on density functional theory (DFT) also confirmed that the addition of Se in the CZT matrix helps to reduce the formation of TeCd and the TeZn antisites. The VBM-grown crystals were characterized using powder X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy (EDS). While the XRD results revealed sharp diffraction peaks confirming the crystalline nature of the grown crystal, the EDS results confirmed the targeted stoichiometry of the elemental composition. The bulk resistivity of the grown crystal was calculated to be $\sim 3\times 10^{10}\,\,\Omega$ -cm from the current–voltage characteristics recorded at room temperature in a planar configuration, ensuring that the grown CZTS crystals have low dark current as required for detector-grade crystals. [ABSTRACT FROM AUTHOR]

In this letter we investigate for the first time the behavioral differences of transport properties of electrons and holes observed in high-resolution radiation detectors fabricated on high-purity single crystalline diamond using biparametric (BP) correlation studies. The chemical vapor deposition (CVD) grown $500~\mu \text{m}$ thick diamonds exhibited an excellent energy resolution of 0.5% for 5486 keV alpha particles for both electron and hole transport in a vertical electrode geometry. Interestingly, the behavior of the electron and hole transport were found to be vastly different at bias voltages less than 100 V. No discernable detector signal was observed due to electron transit below an applied bias of −100 V. The hole transit on the other hand, resulted in resolvable pulse height spectrum (PHS) from bias voltages as low as +10 V. Digital biparametric correlation studies of the rise-times and induced charge from each interaction of the incident alpha particles, revealed that the observed difference is due to the excessive electron trapping below bias voltages of −100 V. At lower biases, the width of the alpha peak in the PHS due to hole movement, was hardly affected by trapping and was observed to be limited due to lower hole drift velocities. The developed method with new insights of correlating the biparametric plots and the detector performance can be extended to vast range of semiconductor detectors. [ABSTRACT FROM AUTHOR]

In this letter we report a direct correlation between the space charge limited current flow and radiation detection properties of CdxZn1-xTe1-ySey (CZTS) detector. CZTS is a recently discovered quaternary wide bandgap semiconductor for room-temperature gamma photon detection. The CZTS single crystals have been grown in-house using a modified Bridgman technique. Planar detectors were fabricated and characterized in terms of charge carrier flow and radiation detection measurements. An anomalous current flow falling outside the Lampert’s triangle in $\textit {logJ}-\textit {logV}$ plot, has been observed which is not generally seen in semiconductor detectors governed by space-charge limited current flow mechanism. The anomalous behavior has been attributed to the presence of electron traps. The devices were tested for their radiation detection properties by acquiring pulse height spectra using 241Am and a 137Cs isotopes as a source of alpha particles and gamma photons, respectively. It was further noticed that the only detectors which worked satisfactorily as radiation detectors, did not exhibit the anomalous current flow mechanism. [ABSTRACT FROM AUTHOR]

Large-volume detector-grade Cd0.9Zn0.1Te (CZT) single crystals were grown using a vertical Bridgman technique. The bulk resistivity of the as-grown crystal was found to be ~ 5 × 1010 Ω-cm from current–voltage measurements. A 19.0 ×19.0 × 5.0 mm3 block of the crystal was used to fabricate a detector with 10 × 10 pixelated anode configuration integrated with interpixel guard rings. The detector was tested for its radiation detection properties using 662-keV gamma rays from a 137Cs source. The pixels exhibited well-resolved gamma pulse-height spectra (PHS) with percentage energy resolution ~1.6% at 662 keV. A few pixels exhibited tailing of the photopeak on the lower energy side indicating the presence of hole traps. Biparametric plots (BPs) were obtained from digitally recorded preamplifier pulses. The BPs showed anomalous behavior, which was correlated with the gamma interactions in the active region of the detector in virtual Frisch grid configuration. The BPs also enabled to extract PHS free from the extensive tailing of the photopeak. [ABSTRACT FROM AUTHOR]