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1. Development of large area SOI pixel sensor "XRPIX-X" with pinned depleted diode structure

2. Development of a neutrino detector and electronics for precise measurement of neutrino cross-section ratios

3. Partial discharge and breakdown mechanisms in ultra-dilute SF6 /N2 gas mixtures

11. A cost-conscious 32nm CMOS platform technology with advanced single exposure lithography and gate-first metal gate/high-k process

12. Impact of tantalum composition in TaC/HfSiON gate stack on device performance of aggressively scaled CMOS devices with SMT and strained CESL

21. FinFET: the prospective multi-gate device for future SoC applications

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