17 results on '"Irie, S."'
Search Results
2. Mask enhancer technology on ArF immersion tool for 45nm-node CMOS with 0.249/spl mu/m/sup 2/ SRAM contact layer fabrication
3. Simulation of an acoustic system using Power Envelope Inverse Filtering.
4. Watermark resolution
5. Service gateway to enable the introduction of content related services
6. Combination of TCAD and physical MOSFET model for LSI development time reduction.
7. The Effect of Morphology on the Impulse Voltage Breakdown in XLPE Cable Insulation.
8. Bow-tie-tree in EPR cables are accelerated water treeing test.
9. Thermal fatigue and aging properties of water-impervious cable.
10. A New Method for the Prevention of Water and Sulfide Penetration and Deterioration of Cross-Linked Polyethylene (XLP) Insulated Submarine Power Cables.
11. Novel resist pattern transfer process for 70 nm technology node using 157-nm lithography
12. Combination of TCAD and physical MOSFET model for LSI development time reduction
13. Mask enhancer technology on ArF immersion tool for 45nm-node CMOS with 0.249μm2 SRAM contact layer fabrication.
14. Outgassed species from 157-nm-irradiated triphenylsulfonium salts.
15. Novel resist pattern transfer process for 70 nm technology node using 157-nm lithography.
16. 157-nm single layer resists based on main-chain-fluorinated polymers.
17. The long service performance of Pb-laminated plastics layer for water-impervious XLPE cable.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.